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 BSP603S2L OptiMOS Power-Transistor
Feature
* N-Channel
Product Summary VDS R DS(on) ID 55 33 5.2
SOT 223
V m A
* Enhancement mode * Logic Level
Type BSP603S2L
Package SOT 223
Ordering Code Q67060-S7213
Marking 2N603L
Maximum Ratings, at Tj = 25 C, unless otherwise specified Parameter Continuous drain current
TA=25C TA=70C
Symbol ID
Value 5.2 4.1
Unit A
Pulsed drain current
TA=25C
ID puls VGS Ptot Tj , Tstg
21 20 1.8 -55... +150 55/150/00 V W C
Gate source voltage Power dissipation
TA=25C
Operating and storage temperature IEC climatic category; DIN IEC 68-1
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BSP603S2L
Thermal Characteristics Parameter Characteristics Thermal resistance, junction - soldering point (Pin 4) Thermal resistance, chip to ambient air:
@ min. footprint @ 6 cm2 cooling area 1)
Symbol min.
RthJS RthJA
Values typ. 15 max. 20
Unit
-
K/W
-
-
120 70
Electrical Characteristics, at Tj = 25 C, unless otherwise specified Parameter Static Characteristics Drain-source breakdown voltage
V GS=0V, I D=1mA
Symbol min. V(BR)DSS VGS(th) IDSS IGSS RDS(on) RDS(on) 55 1.2
Values typ. 1.6 max. 2
Unit
V
Gate threshold voltage, VGS = VDS
ID=50A
Zero gate voltage drain current
V DS=55V, V GS=0V, Tj=25C V DS=55V, V GS=0V, Tj=150C
A 0.1 10 10 27 23 1 100 100 40 33 nA m
Gate-source leakage current
V GS=20V, VDS=0V
Drain-source on-state resistance
V GS=4.5V, ID=2.6A
Drain-source on-state resistance
V GS=10V, ID=2.6A
1Device on 40mm*40mm*1.5mm epoxy PCB FR4 with 6cm (one layer, 70 m thick) copper area for drain connection. PCB is vertical without blown air.
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BSP603S2L
Electrical Characteristics Parameter Dynamic Characteristics Transconductance Input capacitance Output capacitance Reverse transfer capacitance Turn-on delay time gfs Ciss Coss Crss td(on)
VDD =30V, VGS=4.5V, ID=5.2A, RG=5.6 VDS 2*I D*RDS(on)max, ID=5.2 VGS =0V, VDS =25V, f=1MHz
Symbol
Conditions min. 8.9 -
Values typ. 17.8 1034 244 75 10.8 max. -
Unit
S
1390 pF 325 110 16 ns
Rise time Turn-off delay time Fall time
Gate Charge Characteristics Gate to source charge Gate to drain charge Gate charge total Gate plateau voltage
tr td(off) tf
Qgs Qgd Qg
VDD =30V, VGS=4.5V, ID=5.2mA, RG=5.6
-
16 28 15
24 40 23
VDD =44V, ID=5.2A
-
3.5 10.6 31 3
4.6 16 42 -
nC
VDD =44V, ID=5.2A, VGS =0 to 10V
V(plateau) VDD =44V, ID=5.2A
V
Reverse Diode Inverse diode continuous forward current Inv. diode direct current, pulsed Inverse diode forward voltage Reverse recovery time Reverse recovery charge ISM VSD trr Qrr
VGS =0V, IF=5.2A VR =30V, IF=lS , diF/dt=100A/s
IS
TA=25C
-
0.8 46 44
5.2 21 1.1 58 55
A
V ns nC
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BSP603S2L
1 Power dissipation Ptot = f (TC) parameter: V GS 4 V
2.4
BSP603S2L
2 Drain current ID = f (TC) parameter: V GS 10 V
6
BSP603S2L
W
2 1.8
A
5 4.5 4
Ptot
1.6 1.4 1.2 1 0.8 0.6 0.4 0.2 0 0 20 40 60 80 100 120
ID
C
3.5 3 2.5 2 1.5 1 0.5
160
0 0
20
40
60
80
100
120
C
160
TC
TC
3 Safe operating area ID = f ( V DS ) parameter : D = 0 , TC = -10
2 BSP603S2L
4 Max. transient thermal impedance ZthJC = f (t p) parameter : D = t p/T
K/W
tp = 160.0s
10 2
BSP603S2L
A
S( ) on
/I D = VD
S
10 1
10 1
RD
ZthJC
1 ms
10 0
ID
10 0
10 ms
10 -1
D = 0.50 0.20 0.10 0.05 single pulse 0.02 0.01
10 10 -1
-2
10 -3 DC 10 -2 -1 10 10 -4 -6 -5 -4 -3 -2 -1 0 10 10 10 10 10 10 10
10
0
10
1
V
10
2
s
10
2
VDS
Page 4
tp
2003-10-29
BSP603S2L
5 Typ. output characteristic ID = f (VDS); Tj=25C parameter: tp = 80 s
13
BSP603S2L
6 Typ. drain-source on resistance RDS(on) = f (ID) parameter: V GS
110
BSP603S2L
A
11 10 9
Ptot = 1.8W
VGS [V] a 2.8 b c 3.0 3.2 3.4 3.6 3.8 4.0 4.5 10.0
ih gf e
d
90
RDS(on)
80 70 60 50 40 30
g h i VGS [V] =
d 3.4 e f 3.6 3.8 g 4.0 h i 4.5 10.0
d
d e f g h i
ID
8 7 6 5 4 3 2 1 0 0 0.5 1 1.5 2 2.5 3 3.5
a b c
e
f
20 10
4
V
5
0 0
2
4
6
8
A
11
VDS
ID
7 Typ. transfer characteristics ID= f ( VGS ); VDS 2 x ID x RDS(on)max parameter: tp = 80 s
11
8 Typ. forward transconductance g fs = f(ID); Tj=25C parameter: gfs
26
A
9 8
S
22 20 18
ID
7 6 5 4 3 2 1 0 0 0.5 1 1.5 2 2.5
gfs V
16 14 12 10 8 6 4 2
3.5
0 0
2
4
6
8
A ID
12
VGS
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BSP603S2L
9 Drain-source on-state resistance RDS(on) = f (Tj) parameter : ID = 2.6 A, VGS = 10 V
100
BSP603S2L
10 Typ. gate threshold voltage VGS(th) = f (Tj) parameter: V GS = VDS
2.5
80
V
RDS(on)
70 60 50 40 30
VGS(th)
250 A
1.5
50 A
98%
1
typ
20 10 0 -60
C
0.5
-20
20
60
100
180
0 -60
-20
20
60
100
Tj
C 160 Tj
11 Typ. capacitances C = f (VDS) parameter: V GS=0V, f=1 MHz
10
4
12 Forward character. of reverse diode IF = f (VSD) parameter: Tj , tp = 80 s
10 2
BSP603S2L
pF Ciss
10 3
A
10 1
C
Coss
10 2
Crss
IF
10 0
Tj = 25 C typ Tj = 150 C typ Tj = 25 C (98%) Tj = 150 C (98%)
10 1 0 5 10 15 20
V VDS
30
10 -1 0
0.4
0.8
1.2
1.6
2
2.4 V
3
VSD
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BSP603S2L
13 Typ. gate charge VGS = f (QGate) parameter: ID = 5.2 A pulsed
16
BSP603S2L
14 Drain-source breakdown voltage V(BR)DSS = f (Tj) parameter: ID=10 mA
66
BSP603S2L
V
V
12
V(BR)DSS
0,8 VDS max
62
VGS
10
0,2 VDS max
60
8
58
6
56
4
54
2
52
0 0
5
10
15
20
25
30
35
40 nC
50
50 -60
-20
20
60
100
C
180
Q Gate
Tj
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2003-10-29
BSP603S2L
Published by Infineon Technologies AG, Bereichs Kommunikation St.-Martin-Strasse 53, D-81541 Munchen (c) Infineon Technologies AG 1999 All Rights Reserved. Attention please! The information herein is given to describe certain components and shall not be considered as warranted characteristics. Terms of delivery and rights to technical change reserved. We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits, descriptions and charts stated herein. Infineon Technologies is an approved CECC manufacturer. Information For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office in Germany or our Infineon Technologies Reprensatives worldwide (see address list). Warnings Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
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2003-10-29


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